Meiji IM7100 Inverted Metallurgical Microscope

IM7100 Inverted Metallurgical Microscopes

PRICE INCLUDES:
Head Type: Meiji IM7100 Binocular
Illumination: Brightfield Koehler Vertical 6 volt 30 watt halogen
Eyepieces: SWH 10x FN22
Objectives: Planachromat E5X,E10X, E20X, E50X
Stage: Fixed flat-top 180mm X 245mm

MEIJI IM7100 MICROSCOPE DESCRIPTION:
Evaluation of metallurgical specimens is fast and easy with Meiji Techno's IM7000 Inverted Metallograph. The IM7000 Series delivers an excellent performance-to-cost ratio because it has the features and versatility that one would expect to find in more expensive instruments. The IM7000 has an integrated front mounted camera port with adapters available for 35mm, CCD, CMOS and other cameras.

VIEWING HEADS:
The binocular model, the IM7100, incorporates the MA814 Siedentopf-type binocular head while the trinocular model, the IM7100 has the MA816/10 Siedentopf-type trinocular head. The MA816/10 uses an 80/20 beamsplitter that can be engaged for photomicroscopy. (100% to eyetubes or 80% to phototube and 20% to the eyetube.) Each microscope head has the eyetubes inclined at 30 degrees with the left eyetube having graduated diopter settings. The interpupillary distance on the viewing heads is adjustable between 53mm - 75mm.

EYEPIECES:
10X Super Widefield High Eyepoint eyepieces F.N.22 are standard, and 15X and 20X eyepieces are available as an option. A Super Widefield High Eyepoint 10X focusable eyepiece that accepts 25mm reticules is also available.

OBJECTIVE CHANGER:
The smooth-operating, ball bearing mounted, quintuple nosepiece provides effortless objective changes.

OBJECTIVES:
Meiji Techno offers an assortment of Plan Epi Infinity Corrected objectives for Brightfield work.

STAGE:
Ceramic coated left or right-handed, flat top stage measures 191mm x 126mm with x-y travel: 100mm(X) x 100mm(Y). Ergonomically positioned coaxial drop down controls.

ILLUMINATION:
Powerful 50 watt halogen vertical illumination along with 30W Transmitted Koehler Illumination provides super enhanced image quality and brightness for the observation of metallurgical specimens and photomicroscopy.